(Micron[TA])
3,081 results
  • Integrated SEM, TEM and CLSM workflow for tegumental analysis of adult Schistosoma mansoni. [Journal Article]
    Micron. 2026 Sep 26; 208:104119. [Online ahead of print]de Carvalho Augusto R, João RCF, … Santos CPM
  • The tegument of Schistosoma mansoni is a key host-parasite interface and a major target for drug and vaccine development. Although ultrastructural studies of the tegument date back decades, methodological inconsistencies often complicate comparisons across studies. Here, we present a standardized, easy-to-use framework for investigating tegumental architecture using three complementary techniques…
  • Orientation mapping via dictionary indexing of AC-STEM Kikuchi patterns using open-source software. [Journal Article]
    Micron. 2026 Sep 25; 208:104122. [Online ahead of print]Ahmed S, Haust J, … Volz KM
  • The properties of polycrystalline materials are strongly influenced by the spatial arrangement and orientations of individual grains within the microstructure, making nanoscale characterization of grain orientation essential. This is also often the case for small grains in the nm regime explored using scanning transmission electron microscopy (STEM). Automated crystal orientation mapping (ACOM) i…
  • Lashing architecture in a meshed cocoon of a lichen-feeding moth Cyana (Lithosiini: Erebidae). [Journal Article]
    Micron. 2026 Sep 26; 208:104123. [Online ahead of print]Wikantyoso B, Rafidah HS, … Ariyanto DPM
  • A cocoon is a protective outer casing that supports metamorphosis of lepidopteran insects. While some lepidopteran species build cocoons solely from silk, others may incorporate other surrounding materials or recycled body parts into their cocoons. Despite extensive knowledge of cocoons from commercially valuable species, information from species that secrete a low amount of silk remains scant. T…
  • Transferring and cleaning suspended WS2 monolayers for electron ptychography characterization. [Journal Article]
    Micron. 2026 Aug 30; 208:104105. [Online ahead of print]Hagopian N, He Y, … Voyles PMM
  • Despite their weak out-of-plane interactions, two-dimensional materials such as WS2 can retain appreciable contamination on their surfaces, complicating characterization in the electron microscope. Polymers and other heavy molecular weight compounds have been historically challenging to remove despite many conventional cleaning procedures attempted. We investigate the influence of sample exfoliat…
  • Optical point-spread function via defocus phase retrieval in scanning electron microscopy. [Journal Article]
    Micron. 2026 Aug 27; 208:104097. [Online ahead of print]Kamal S, Nyaburi KM, Hailstone RKM
  • The point-spread function of the probe-forming optics (PSFoptics) is reported in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, information about the electron probe is generally lost as the beam interacts with the specimen. Here, we demonstrate an approach for recovering probe phase information from reconstructed probe intensity estimates. Controlled …
  • Optical-feedback scanning ion conductance microscopy with high-speed and low-overshoot probe control. [Journal Article]
    Micron. 2026 Nov; 207:104096.Shi S, Wu W, … Zhuang JM
  • At present, the hopping mode of scanning ion conductance microscopy (SICM) is the mainstream method for probing complex sample topography. However, conventional SICM typically relies on built-in electrical sensors for Z-axis feedback control, and the dynamic performance of this feedback path can be limited by sensor bandwidth, readout delay, and system-level disturbances during high-speed scannin…