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Dedicated finite elements for electrode thin films on quartz resonators.
IEEE Trans Ultrason Ferroelectr Freq Control. 2008 Aug; 55(8):1686-97.IT

Abstract

The accuracy of the finite element analysis for thickness shear quartz resonators is a function of the mesh resolution; the finer the mesh resolution, the more accurate the finite element solution. A certain minimum number of elements are required in each direction for the solution to converge. This places a high demand on memory for computation, and often the available memory is insufficient. Typically the thickness of the electrode films is very small compared with the thickness of the resonator itself; as a result, electrode elements have very poor aspect ratios, and this is detrimental to the accuracy of the result. In this paper, we propose special methods to model the electrodes at the crystal interface of an AT cut crystal. This reduces the overall problem size and eliminates electrode elements having poor aspect ratios. First, experimental data are presented to demonstrate the effects of electrode film boundary conditions on the frequency-temperature curves of an AT cut plate. Finite element analysis is performed on a mesh representing the resonator, and the results are compared for testing the accuracy of the analysis itself and thus validating the results of analysis. Approximations such as lumping and Guyan reduction are then used to model the electrode thin films at the electrode interface and their results are studied. In addition, a new approximation called merging is proposed to model electrodes at the electrode interface.

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Publisher Full Text (DOI)

Authors+Show Affiliations

Srivastava SA
Dept. of Civil & Environ. Eng., Rutgers Univ., Piscataway, NJ, USA. sonalsri@gmail.com
Yong YK
No affiliation info available
Tanaka M
No affiliation info available
Imai T
No affiliation info available

MeSH

AcousticsComputer SimulationComputer-Aided DesignElectrodesElectronicsEquipment DesignEquipment Failure AnalysisFinite Element AnalysisMembranes, ArtificialModels, TheoreticalQuartzReproducibility of ResultsScattering, RadiationSensitivity and SpecificityTransducersVibration

Pub Type(s)

Evaluation Study
Journal Article

Language

eng

PubMed ID

18986913

Citation

Srivastava, Sonal A., et al. "Dedicated Finite Elements for Electrode Thin Films On Quartz Resonators." IEEE Transactions On Ultrasonics, Ferroelectrics, and Frequency Control, vol. 55, no. 8, 2008, pp. 1686-97.
Srivastava SA, Yong YK, Tanaka M, et al. Dedicated finite elements for electrode thin films on quartz resonators. IEEE Trans Ultrason Ferroelectr Freq Control. 2008;55(8):1686-97.
Srivastava, S. A., Yong, Y. K., Tanaka, M., & Imai, T. (2008). Dedicated finite elements for electrode thin films on quartz resonators. IEEE Transactions On Ultrasonics, Ferroelectrics, and Frequency Control, 55(8), 1686-97. https://doi.org/10.1109/TUFFC.2008.854
Srivastava SA, et al. Dedicated Finite Elements for Electrode Thin Films On Quartz Resonators. IEEE Trans Ultrason Ferroelectr Freq Control. 2008;55(8):1686-97. PubMed PMID: 18986913.
* Article titles in AMA citation format should be in sentence-case
TY - JOUR T1 - Dedicated finite elements for electrode thin films on quartz resonators. AU - Srivastava,Sonal A, AU - Yong,Yook-Kong, AU - Tanaka,Masako, AU - Imai,Tsutomu, PY - 2008/11/7/pubmed PY - 2009/1/31/medline PY - 2008/11/7/entrez SP - 1686 EP - 97 JF - IEEE transactions on ultrasonics, ferroelectrics, and frequency control JO - IEEE Trans Ultrason Ferroelectr Freq Control VL - 55 IS - 8 N2 - The accuracy of the finite element analysis for thickness shear quartz resonators is a function of the mesh resolution; the finer the mesh resolution, the more accurate the finite element solution. A certain minimum number of elements are required in each direction for the solution to converge. This places a high demand on memory for computation, and often the available memory is insufficient. Typically the thickness of the electrode films is very small compared with the thickness of the resonator itself; as a result, electrode elements have very poor aspect ratios, and this is detrimental to the accuracy of the result. In this paper, we propose special methods to model the electrodes at the crystal interface of an AT cut crystal. This reduces the overall problem size and eliminates electrode elements having poor aspect ratios. First, experimental data are presented to demonstrate the effects of electrode film boundary conditions on the frequency-temperature curves of an AT cut plate. Finite element analysis is performed on a mesh representing the resonator, and the results are compared for testing the accuracy of the analysis itself and thus validating the results of analysis. Approximations such as lumping and Guyan reduction are then used to model the electrode thin films at the electrode interface and their results are studied. In addition, a new approximation called merging is proposed to model electrodes at the electrode interface. SN - 1525-8955 UR - https://www.unboundmedicine.com/medline/citation/18986913/Dedicated_finite_elements_for_electrode_thin_films_on_quartz_resonators_ L2 - https://dx.doi.org/10.1109/TUFFC.2008.854 DB - PRIME DP - Unbound Medicine ER -