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The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method.
Opt Express. 2009 Nov 09; 17(23):20714-20.OE

Abstract

We have explicated the Goos-Hänchen (GH) shift in a mum-order Kretchmann-Raether configuration embedded in an optical waveguide structure by using the finite-difference time-domain method. For optical waveguide-type surface plasmon resonance (SPR) devices, the precise derivation of the GH shift has become critical. Artmann's equation, which is accurate enough for bulk optics, is difficult to apply to waveguide-type SPR devices. This is because Artmann's equation, based on the differentiation of the phase shift, is inaccurate at the critical and resonance angles where drastic phase changes occur. In this study, we accurately identified both the positive and the negative GH shifts around the incidence angle of resonance. In a waveguide-type Kretchmann-Raether configuration with an Au thin film of 50 nm, positive and negative lateral shifts of -0.75 and + 1.0 microm are obtained on the SPR with the incident angles of 44.4 degrees and 47.5 degrees, respectively, at a wavelength of 632.8 nm.

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Authors+Show Affiliations

Oh GY
School of Electrical and Electronics Engineering, Chung-Ang University, 221 Heuksuk-dong, Dongjak-gu, Seoul 156-756, Korea.
Kim DG
No affiliation info available
Choi YW
No affiliation info available

MeSH

Equipment DesignMetalsModels, StatisticalOptical DevicesOptics and PhotonicsOscillometryRefractometryReproducibility of ResultsSurface Plasmon Resonance

Pub Type(s)

Journal Article
Research Support, Non-U.S. Gov't

Language

eng

PubMed ID

19997302

Citation

Oh, Geum-Yoon, et al. "The Characterization of GH Shifts of Surface Plasmon Resonance in a Waveguide Using the FDTD Method." Optics Express, vol. 17, no. 23, 2009, pp. 20714-20.
Oh GY, Kim DG, Choi YW. The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method. Opt Express. 2009;17(23):20714-20.
Oh, G. Y., Kim, D. G., & Choi, Y. W. (2009). The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method. Optics Express, 17(23), 20714-20. https://doi.org/10.1364/OE.17.020714
Oh GY, Kim DG, Choi YW. The Characterization of GH Shifts of Surface Plasmon Resonance in a Waveguide Using the FDTD Method. Opt Express. 2009 Nov 9;17(23):20714-20. PubMed PMID: 19997302.
* Article titles in AMA citation format should be in sentence-case
TY - JOUR T1 - The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method. AU - Oh,Geum-Yoon, AU - Kim,Doo Gun, AU - Choi,Young-Wan, PY - 2009/12/10/entrez PY - 2009/12/10/pubmed PY - 2010/3/23/medline SP - 20714 EP - 20 JF - Optics express JO - Opt Express VL - 17 IS - 23 N2 - We have explicated the Goos-Hänchen (GH) shift in a mum-order Kretchmann-Raether configuration embedded in an optical waveguide structure by using the finite-difference time-domain method. For optical waveguide-type surface plasmon resonance (SPR) devices, the precise derivation of the GH shift has become critical. Artmann's equation, which is accurate enough for bulk optics, is difficult to apply to waveguide-type SPR devices. This is because Artmann's equation, based on the differentiation of the phase shift, is inaccurate at the critical and resonance angles where drastic phase changes occur. In this study, we accurately identified both the positive and the negative GH shifts around the incidence angle of resonance. In a waveguide-type Kretchmann-Raether configuration with an Au thin film of 50 nm, positive and negative lateral shifts of -0.75 and + 1.0 microm are obtained on the SPR with the incident angles of 44.4 degrees and 47.5 degrees, respectively, at a wavelength of 632.8 nm. SN - 1094-4087 UR - https://www.unboundmedicine.com/medline/citation/19997302/The_characterization_of_GH_shifts_of_surface_plasmon_resonance_in_a_waveguide_using_the_FDTD_method_ L2 - http://www.opticsinfobase.org/abstract.cfm?URI=oe-17-23-20714 DB - PRIME DP - Unbound Medicine ER -