Graphene-graphite oxide field-effect transistors.Nano Lett. 2012 Mar 14; 12(3):1165-9.NL
Abstract
Graphene's high mobility and two-dimensional nature make it an attractive material for field-effect transistors. Previous efforts in this area have used bulk gate dielectric materials such as SiO(2) or HfO(2). In contrast, we have studied the use of an ultrathin layered material, graphene's insulating analogue, graphite oxide. We have fabricated transistors comprising single or bilayer graphene channels, graphite oxide gate insulators, and metal top-gates. The graphite oxide layers show relatively minimal leakage at room temperature. The breakdown electric field of graphite oxide was found to be comparable to SiO(2), typically ~1-3 × 10(8) V/m, while its dielectric constant is slightly higher, κ ≈ 4.3.
Links
MeSH
Pub Type(s)
Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
Language
eng
PubMed ID
22380722
Citation
Standley, Brian, et al. "Graphene-graphite Oxide Field-effect Transistors." Nano Letters, vol. 12, no. 3, 2012, pp. 1165-9.
Standley B, Mendez A, Schmidgall E, et al. Graphene-graphite oxide field-effect transistors. Nano Lett. 2012;12(3):1165-9.
Standley, B., Mendez, A., Schmidgall, E., & Bockrath, M. (2012). Graphene-graphite oxide field-effect transistors. Nano Letters, 12(3), 1165-9. https://doi.org/10.1021/nl2028415
Standley B, et al. Graphene-graphite Oxide Field-effect Transistors. Nano Lett. 2012 Mar 14;12(3):1165-9. PubMed PMID: 22380722.
* Article titles in AMA citation format should be in sentence-case
TY - JOUR
T1 - Graphene-graphite oxide field-effect transistors.
AU - Standley,Brian,
AU - Mendez,Anthony,
AU - Schmidgall,Emma,
AU - Bockrath,Marc,
Y1 - 2012/03/01/
PY - 2012/3/3/entrez
PY - 2012/3/3/pubmed
PY - 2012/7/4/medline
SP - 1165
EP - 9
JF - Nano letters
JO - Nano Lett
VL - 12
IS - 3
N2 - Graphene's high mobility and two-dimensional nature make it an attractive material for field-effect transistors. Previous efforts in this area have used bulk gate dielectric materials such as SiO(2) or HfO(2). In contrast, we have studied the use of an ultrathin layered material, graphene's insulating analogue, graphite oxide. We have fabricated transistors comprising single or bilayer graphene channels, graphite oxide gate insulators, and metal top-gates. The graphite oxide layers show relatively minimal leakage at room temperature. The breakdown electric field of graphite oxide was found to be comparable to SiO(2), typically ~1-3 × 10(8) V/m, while its dielectric constant is slightly higher, κ ≈ 4.3.
SN - 1530-6992
UR - https://www.unboundmedicine.com/medline/citation/22380722/Graphene_graphite_oxide_field_effect_transistors_
L2 - https://doi.org/10.1021/nl2028415
DB - PRIME
DP - Unbound Medicine
ER -