Citation
Arnold, Heather N., et al. "Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics." ACS Applied Materials & Interfaces, vol. 8, no. 8, 2016, pp. 5058-64.
Arnold HN, Cress CD, McMorrow JJ, et al. Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics. ACS Appl Mater Interfaces. 2016;8(8):5058-64.
Arnold, H. N., Cress, C. D., McMorrow, J. J., Schmucker, S. W., Sangwan, V. K., Jaber-Ansari, L., Kumar, R., Puntambekar, K. P., Luck, K. A., Marks, T. J., & Hersam, M. C. (2016). Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics. ACS Applied Materials & Interfaces, 8(8), 5058-64. https://doi.org/10.1021/acsami.5b12259
Arnold HN, et al. Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics. ACS Appl Mater Interfaces. 2016 Mar 2;8(8):5058-64. PubMed PMID: 26882215.
TY - JOUR
T1 - Tunable Radiation Response in Hybrid Organic-Inorganic Gate Dielectrics for Low-Voltage Graphene Electronics.
AU - Arnold,Heather N,
AU - Cress,Cory D,
AU - McMorrow,Julian J,
AU - Schmucker,Scott W,
AU - Sangwan,Vinod K,
AU - Jaber-Ansari,Laila,
AU - Kumar,Rajan,
AU - Puntambekar,Kanan P,
AU - Luck,Kyle A,
AU - Marks,Tobin J,
AU - Hersam,Mark C,
Y1 - 2016/02/18/
PY - 2016/2/17/entrez
PY - 2016/2/18/pubmed
PY - 2016/2/18/medline
KW - chemical vapor deposition graphene
KW - field-effect transistor
KW - hybrid dielectrics
KW - low-voltage electronics
KW - radiation effects
KW - total ionizing dose
SP - 5058
EP - 64
JF - ACS applied materials & interfaces
JO - ACS Appl Mater Interfaces
VL - 8
IS - 8
N2 - Solution-processed semiconductor and dielectric materials are attractive for future lightweight, low-voltage, flexible electronics, but their response to ionizing radiation environments is not well understood. Here, we investigate the radiation response of graphene field-effect transistors employing multilayer, solution-processed zirconia self-assembled nanodielectrics (Zr-SANDs) with ZrOx as a control. Total ionizing dose (TID) testing is carried out in situ using a vacuum ultraviolet source to a total radiant exposure (RE) of 23.1 μJ/cm(2). The data reveal competing charge density accumulation within and between the individual dielectric layers. Additional measurements of a modified Zr-SAND show that varying individual layer thicknesses within the gate dielectric tuned the TID response. This study thus establishes that the radiation response of graphene electronics can be tailored to achieve a desired radiation sensitivity by incorporating hybrid organic-inorganic gate dielectrics.
SN - 1944-8252
UR - https://www.unboundmedicine.com/medline/citation/26882215/Tunable_Radiation_Response_in_Hybrid_Organic_Inorganic_Gate_Dielectrics_for_Low_Voltage_Graphene_Electronics_
L2 - https://doi.org/10.1021/acsami.5b12259
DB - PRIME
DP - Unbound Medicine
ER -