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Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population.
Int J Mol Sci. 2019 Oct 31; 20(21)IJ

Abstract

Tan spot (TS) and Septoria nodorum blotch (SNB) induced by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, cause significant yield losses and adversely affect grain quality. The objectives of this study were to decipher the genetics and map the resistance to TS and SNB in the PBW343/Kenya Nyangumi (KN) population comprising 204 F6 recombinant inbred lines (RILs). Disease screening was performed at the seedling stage under greenhouse conditions. TS was induced by P. tritici-repentis isolate MexPtr1 while SNB by P. nodorum isolate MexSN1. Segregation pattern of the RILs indicated that resistance to TS and SNB in this population was quantitative. Diversity Array Technology (DArTs) and simple sequence repeats (SSRs) markers were used to identify the quantitative trait loci (QTL) for the diseases using inclusive composite interval mapping (ICIM). Seven significant additive QTLs for TS resistance explaining 2.98 to 23.32% of the phenotypic variation were identified on chromosomes 1A, 1B, 5B, 7B and 7D. For SNB, five QTLs were found on chromosomes 1A, 5A, and 5B, explaining 5.24 to 20.87% of the phenotypic variation. The TS QTL on 1B chromosome coincided with the pleiotropic adult plant resistance (APR) gene Lr46/Yr29/Pm39. This is the first report of the APR gene Lr46/Yr29/Pm39 contributing to TS resistance.

Authors+Show Affiliations

International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. pk.singh@cgiar.org.International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. Sukh.Singh@cgiar.org.International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. deng868@163.com. State Key Laboratory of Crop Biology, Cooperation Innovation Center of Efficient Production with High Annual Yield of Wheat and Corn, Shandong Agricultural University, Taian 271018, China. deng868@163.com.International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. x.he@cgiar.org.International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. Z.Kehel@cgiar.org.International Maize and Wheat Improvement Center (CIMMYT), Apdo. Postal 6-641, México 06600, D.F., Mexico. R.Singh@cgiar.org.

Pub Type(s)

Journal Article

Language

eng

PubMed ID

31683619

Citation

Singh, Pawan Kumar, et al. "Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population." International Journal of Molecular Sciences, vol. 20, no. 21, 2019.
Singh PK, Singh S, Deng Z, et al. Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. Int J Mol Sci. 2019;20(21).
Singh, P. K., Singh, S., Deng, Z., He, X., Kehel, Z., & Singh, R. P. (2019). Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. International Journal of Molecular Sciences, 20(21). https://doi.org/10.3390/ijms20215432
Singh PK, et al. Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. Int J Mol Sci. 2019 Oct 31;20(21) PubMed PMID: 31683619.
* Article titles in AMA citation format should be in sentence-case
TY - JOUR T1 - Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. AU - Singh,Pawan Kumar, AU - Singh,Sukhwinder, AU - Deng,Zhiying, AU - He,Xinyao, AU - Kehel,Zakaria, AU - Singh,Ravi Prakash, Y1 - 2019/10/31/ PY - 2019/09/25/received PY - 2019/10/25/revised PY - 2019/10/28/accepted PY - 2019/11/6/entrez PY - 2019/11/7/pubmed PY - 2020/3/31/medline KW - Genetics KW - Parastagonospora nodorum KW - Pyrenophora tritici-repentis KW - Triticum aestivum KW - host-pathogen interaction JF - International journal of molecular sciences JO - Int J Mol Sci VL - 20 IS - 21 N2 - Tan spot (TS) and Septoria nodorum blotch (SNB) induced by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, cause significant yield losses and adversely affect grain quality. The objectives of this study were to decipher the genetics and map the resistance to TS and SNB in the PBW343/Kenya Nyangumi (KN) population comprising 204 F6 recombinant inbred lines (RILs). Disease screening was performed at the seedling stage under greenhouse conditions. TS was induced by P. tritici-repentis isolate MexPtr1 while SNB by P. nodorum isolate MexSN1. Segregation pattern of the RILs indicated that resistance to TS and SNB in this population was quantitative. Diversity Array Technology (DArTs) and simple sequence repeats (SSRs) markers were used to identify the quantitative trait loci (QTL) for the diseases using inclusive composite interval mapping (ICIM). Seven significant additive QTLs for TS resistance explaining 2.98 to 23.32% of the phenotypic variation were identified on chromosomes 1A, 1B, 5B, 7B and 7D. For SNB, five QTLs were found on chromosomes 1A, 5A, and 5B, explaining 5.24 to 20.87% of the phenotypic variation. The TS QTL on 1B chromosome coincided with the pleiotropic adult plant resistance (APR) gene Lr46/Yr29/Pm39. This is the first report of the APR gene Lr46/Yr29/Pm39 contributing to TS resistance. SN - 1422-0067 UR - https://www.unboundmedicine.com/medline/citation/31683619/Characterization_of_QTLs_for_Seedling_Resistance_to_Tan_Spot_and_Septoria_Nodorum_Blotch_in_the_PBW343/Kenya_Nyangumi_Wheat_Recombinant_Inbred_Lines_Population_ L2 - https://www.mdpi.com/resolver?pii=ijms20215432 DB - PRIME DP - Unbound Medicine ER -