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Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization.
ACS Nano. 2020 Jul 28; 14(7):8838-8845.AN

Abstract

Surface-enhanced Raman spectroscopy (SERS) is an ultrasensitive technique to identify vibrational fingerprints of trace analytes. However, present SERS techniques suffer from the lack of uniform, reproducible, and stable substrates to control the plasmonic hotspots in a wide spectral range. Here, we report the promising application of epitaxial aluminum films as a scalable plasmonic platform for SERS applications. To assess the uniformity of aluminum substrates, atomically thin transition metal dichalcogenide monolayers are used as the benchmark analyte due to their inherent two-dimensional homogeneity. Besides the distinctive spectral capability of aluminum in the ultraviolet (325 nm), we demonstrate that the aluminum substrates can even perform comparably with the silver counterparts made from single-crystalline colloidal silver crystals using the same SERS substrate design in the visible range (532 nm). This is unexpected from the prediction solely based on optical dielectric functions and illustrate the superior surface and interface properties of epitaxial aluminum SERS substrates.

Authors+Show Affiliations

Institute of Nanoengineering and Microsystems, National Tsing-Hua University, Hsinchu 30013, Taiwan.Department of Physics, National Tsing-Hua University, Hsinchu 30013, Taiwan.Department of Physics, National Tsing-Hua University, Hsinchu 30013, Taiwan. School of Physics, Peking University, Beijing 100871, China.Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan.Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan.Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan.Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan.Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan.Institute of Nanoengineering and Microsystems, National Tsing-Hua University, Hsinchu 30013, Taiwan. Department of Physics, National Tsing-Hua University, Hsinchu 30013, Taiwan. Center for Applied Sciences, Academia Sinica, Nankang, Taipei 11529, Taiwan.

Pub Type(s)

Journal Article

Language

eng

PubMed ID

32589398

Citation

Raja, Soniya S., et al. "Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization." ACS Nano, vol. 14, no. 7, 2020, pp. 8838-8845.
Raja SS, Cheng CW, Sang Y, et al. Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization. ACS Nano. 2020;14(7):8838-8845.
Raja, S. S., Cheng, C. W., Sang, Y., Chen, C. A., Zhang, X. Q., Dubey, A., Yen, T. J., Chang, Y. M., Lee, Y. H., & Gwo, S. (2020). Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization. ACS Nano, 14(7), 8838-8845. https://doi.org/10.1021/acsnano.0c03462
Raja SS, et al. Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization. ACS Nano. 2020 Jul 28;14(7):8838-8845. PubMed PMID: 32589398.
* Article titles in AMA citation format should be in sentence-case
TY - JOUR T1 - Epitaxial Aluminum Surface-Enhanced Raman Spectroscopy Substrates for Large-Scale 2D Material Characterization. AU - Raja,Soniya S, AU - Cheng,Chang-Wei, AU - Sang,Yungang, AU - Chen,Chun-An, AU - Zhang,Xin-Quan, AU - Dubey,Abhishek, AU - Yen,Ta-Jen, AU - Chang,Yu-Ming, AU - Lee,Yi-Hsien, AU - Gwo,Shangjr, Y1 - 2020/06/30/ PY - 2020/6/27/pubmed PY - 2020/6/27/medline PY - 2020/6/27/entrez KW - SERS substrate KW - UV-SERS KW - epitaxial aluminum film KW - monolayer transition metal dichalcogenide KW - plasmonics KW - surface-enhanced Raman spectroscopy (SERS) SP - 8838 EP - 8845 JF - ACS nano JO - ACS Nano VL - 14 IS - 7 N2 - Surface-enhanced Raman spectroscopy (SERS) is an ultrasensitive technique to identify vibrational fingerprints of trace analytes. However, present SERS techniques suffer from the lack of uniform, reproducible, and stable substrates to control the plasmonic hotspots in a wide spectral range. Here, we report the promising application of epitaxial aluminum films as a scalable plasmonic platform for SERS applications. To assess the uniformity of aluminum substrates, atomically thin transition metal dichalcogenide monolayers are used as the benchmark analyte due to their inherent two-dimensional homogeneity. Besides the distinctive spectral capability of aluminum in the ultraviolet (325 nm), we demonstrate that the aluminum substrates can even perform comparably with the silver counterparts made from single-crystalline colloidal silver crystals using the same SERS substrate design in the visible range (532 nm). This is unexpected from the prediction solely based on optical dielectric functions and illustrate the superior surface and interface properties of epitaxial aluminum SERS substrates. SN - 1936-086X UR - https://www.unboundmedicine.com/medline/citation/32589398/Epitaxial_Aluminum_Surface-Enhanced_Raman_Spectroscopy_Substrates_for_Large-Scale_2D_Material_Characterization L2 - https://doi.org/10.1021/acsnano.0c03462 DB - PRIME DP - Unbound Medicine ER -
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